Orienting device



J. c. LULEY 2,394,622

yORIENTING' DEVICE Feb. l2, 1946.

Filed oct'. 19, -1943 4 sheets-sheet 1 INVE/VroR J C. LULEV Arron/ver Feb. 12, 1946.

J. C. LULEY OBIENTING DEVICE Filed Oct. 19, 1945 Flea 4 sheets-sheet 2 /NVENTOR .J C. LULEY l R MVM A rroA/E? Feb. 12,A 1.946. J. c, LUL'EY Y 2,394,622

ORIENTING DEVICE Filed Oct. 19, 1943 4 Sheets-Sheet 4 Patented Feb. 12, 1946 ORIENTING DEVICE John C. Luley, Teaneck, N. J., assigner to Western Electric Company, Incorporated, New York, N. Y., a corporation of New York Application October 19, 1943, Serial No. 506,906

(Cl. Z50-52) 12 Claims.

This invention relates to orienting devices, and more particularly to devices for orienting quartz crystals in determining certain axes thereof.

In the processing of quartz crystals to obtain therefrom quartz crystal plates for use in electrical units, it is important to determine the location of certain of the existing axes in the quartz crystals to determine the relative location of a crystal with a saw which is to cut the crystal into sections.

An object of the invention is to provide an orienting device which is simple in structure, easily operable and highly efficient in orienting an article relative to a given point.

With this and other objects in view, the invention comprises an orienting device having a stationary table for receiving a base plate upon which a mounting element for an article is disposed for rotation, mechanism for moving the mounting element with the article about a xed point relative to the base plate, and clamps on the latter for clamping the mounting element at a selected position thereon.

Other objects and advantages will be apparent from the following detailed description when considered in conjunction with the accompanying drawings, wherein Fig. 1 is a top plan View of the device shown in combination with an X-ray unit and unit sensitive to X-rays;

Fig. 2 is a vertical sectional view taken along the line 2-2 of Fig. 1;

Fig. 3 is a fragmentary sectional View taken substantially along the line 3-3 of Fig. 2, portions thereof being broken away;

Fig. 4 is a fragmentary sectional View taken substantially along the line 4-4 of Fig. 2;

Fig. 5 is a fragmentary sectional view taken substantially along the line 5-5 of Fig, 2;

Fig. 6 is a schematic top plan View of the device shown in conjunction With the X-ray unit and the unit sensitive to X-rays;

Fig. 7 is a fragmentary sectional view taken substantially along the line 1 1 of Fig. 4, and

Fig. 8 is a top plan view of the attaching element and the table supporting it.

Referring now to the drawings, attention is rst directed to Fig. 6, which illustrates a table Ill upon which an orienting device, indicated generally at Il, is mountedin a desired position relative to an X-ray unit I2 and a unit I4 sensitive to X-rays, the latter being commercially known as an ionization chamber. Quartz crystals,one of which is indicated at I5, are naturally hexagonalin cross-section, providing six natural sides if, during the obtaining of the crystals, such as by mining or other methods, the crystals are not broken. The crystal shown in Fig. 6 has certain of its natural sides broken away, natural side I6 being employed in the present instance to determine what is meant as the X or electric axis of the crystal. If the crystal is broken so that there exists no natural side or face, a flat surface is ground on a portion of the crystal and from this surface the axis is determined.

The crystal I5 is cemented or secured in any other suitable manner upon a circular mounting plate provided with an annular iiange I8 at its periphery. In addition to the mounting plate, an H-shaped base plate or attaching element I9, shown more clearly in Fig. 8, is employed in attaching the crystal and its mounting plate upon the Work support of a cutting apparatus (not shown) for use in cutting the crystal into sections. The H-shaped element I9 is formed to be mounted in a given position upon the Work support of the cutting apparatus. Therefore, to assure the mounting of the crystal with the selected axis thereof at a given angle with respect to the saw or cutting element, it is necessary to secure the mounting plate II upon the element I9 with the said axis extending in a given direction. Therefore, the orienting device II, as illustrated in Fig. 6, is mounted with respect to the units I2 and I4 so this result may be accomplished.

A table 22 is provided With a plurality of 1ocating elements 23 having flat surfaces, as shown, for the location of the element I9 therebetween, as illustrated in Fig. 8, and for the movement of the element toward a locating finger 24. The extreme end of the nge'r 24 when in the locating position shown in Figs. 1, 2 and 6, is disposed at a point in the path of an X-ray beam, indicated at 25, projecting from the unit I2. In determining the electric axis of the crystal, it is important that a given point in the natural side or face of the crystal be moved about an axis Where the X-ray beam meets this surface. This is the purpose of the locating finger, to locate a given point of the surface of the crystal where it meets the X-ray beam. By orienting the crystal until the beam 25 is reflected at an angle for most efficient registration with the unit I4, the crystal is moved to locate the electric axis at a given position relative to the element I9.

The locating finger 24 is pivotally supported, at 28, upon a bracket 29, the latter being mounted upon the table I0. Through the aid of the pivot Y28, the finger may be moved out of engagement With the crystal after it has served its purpose.

Y element.

Clamps 3o and 3l are disposed upon the'element I9 and formed, when their retaining Vscrews 'l2 Y ,areV loosened sufdcientlyl to permit rotation of the mounting plate ll thereon but to maintain general relative positions of the mounting plate and element. The annular flange I8 of the mounting plate rides in a groove 33 of the clamp 3i during rotation of the mounting plate relative to the A iixed member 35, parallel with the table 22 Vand spaced therefrom, as shown in Fig. 2, has an embossed portion 35 integral therewith and apertured to receive the upper end of a threaded support s? upon which the member is mounted Y and Ysecured against rotation relative thereto, as

at 38. The table 22 is supported by the member through the aid of connecting pins or elements Y Lili, having enlarged central portions providing shoulders respectively engaging the member t5 and the table to space them a given distance apart. An 'oscillating element lll, interposed between'the member 35 and the table 22, is xedV toa threadedend d2 'of a shaft 53, as at M, the shaft `being 'disposed concentric'ally in the threaded support 3lV and rotatablyjournalled in bearings therein. Elongate rarcuate apertures d5' andv 21 are provided in the oscillating element 4| adjacent the pins 'diktecondi-tionV the element 6i 7 for vmovement relative Vto the :pins as well asrthe At diametrically g .-opposedpositions, L-shaped integral portions 11S member 35 and the table 122.

mounting 'plate with the crystal relative to 'the table 22 and the element. I 3. Y The moving means includes a worm `gear 352 rotatably @emailed on a spin-die' se, mev latter being 'supported bythe member ll5 as shown in Fig.v 2.Y A worm 5d, mounted upon Ya shaft '55, interengages the `worm gear `'52 (Fig. kil). The shaft vis journalled in lsi'iitable bearings, indicated at 56,' and has a hand wheel 5l mounted on the outer endthereo'f lthrou'ghfthe aid of which the shaft may be rotated. A vVertieall-y projecting pin, carried by the Worm gear 52, as illu'strated Vin Figs. Zand 5, extends vthrough an arcuate aper-V ture 53 (Figs. 2, 3, 4 and 5), an upper reduced end Y(il) of the pin Abeing V,iouii'ialled in a bearing blockl.

awaycportion 63 .in the element 'Mrand is's/ecured in pla-ccas at 64. The Vbearing block 6i is square in cross-section,V as shown in Fig. 3, and is disposed forldngitudinal movement in a recess er groove 65`in the bracket, the recess extending'the ful-l width thereof. i f Y Returning Y'new to Figs. 2 'and 7., 'it win be notes that 'a' tubular Yhousing '66 is provided for the Y 'Irfhe aperture 59 is in the member 3,5, Y thevr'adialcenter thereof bein-g at'the center of Ythe spindle 53. VA bracket 62 is ldisposedin a cutvgrip the mountingV plate Il' so as Ato move the Y a screw 69, carried by the housing 66, to permit vertical movement of thesupport, but to main# tain the latter together with the table 22 and member 35 against rotation (Fig. 7). A base plate 10, having a yoke-like end H receivable in an annular groove 'l2 of theupper portion of the housing 66, serves to support Vthe unit it at a given point With respect tov thevcenter line of the shaft 43. A worm gear 73, disposed upon the threaded portion of the support 3l and having internal threads engaging therewith, presses upon the upper end of the housing 65 and serves as apart of the means to elevate the main structure of the device to locate the article vertically relative to Vthe X-ray beam 25. A worm i4 (Figs. 4 and 7) is fixedly `mounted upon a shaft'r'i and interengages'the Worm gear T3. The shaft l5 is journalled in suitable bearings 'F6 and has a hand wheel il mounted upon the outerend thereof, as illustrated in Fig. 6. AnY intertting retaining member 1-8, carried by the base plate servesV to hold the Worm gear 13 agains'tvert'i'cal movement. J Y

Upon consi/dering the operati-on of the orienti. ing device in combination with the X-ray. unit I2 and 'the ionization chamber or unit lil, let it'be assumed that the crystal IIEi has lbeen select-ed and `suitably 'mounted upon the mounting plate il. The mounting plate Il With the 'crystal isY then disposed upon the H-shape'd element i9 and loosely held thereon against -accidentalA displacement but for Vrelative rotation through the aid of clamps :and 3i. This vassembly 'is then placed upon the table '22 between the elements 23, as shown in Fig. 8. With the locat- Y oscillating element il! through the aid' of clampsY 59, and after the'ng'er 2li is moved lout of "en- Vga'ge'ment with the crystal, 'the device is'infreadiness for orientation of the crystal to move the point which previously engaged the finger about a vertical axis intersecting 'the vpoint ofthe re- `Flection of 'the X-'ray beam Z5 until 'the beam is caused to reilec't into the ionization ehamber, as illustrated in Fig. 6. At this, time the loca- Y tion cf the X or electric axis of the crystal vwill be .known and the crystal will be located with respect' to Vtine longitudinal center li-ne of the element i9. 'To produce .piezoelectric 4plates with the desired'characteristics, 'it is important. 'that 'the original cuts in the c'rystahto 'producjethe threaded. support 'illY and is fixedly mounted in K y an aperture (5l 1in .the table zl'.VV The threaded Y portion ofthe support V3l extends above the hous ing', the'portion of the support Ywithin the-housing having a smooth outer surface adapting the supp Y, Aport for vertical `mjvement in the housing. A

werden 'Sintes is formed m the' lower pon-,ion of th 'Support 31 to Coperatie `a reduced End of.

slabs4 from which thelplates are finallycutQ-eiitend Vat la given angle from'the X or electric yaids.'

The crystalAV is oriented through actuation. of

the hand/wheel '51,' to cause Yrotation of the VWorm E@ to move the wormgear'in either direction about the axis of `tlliesha'ft E3. .In sof-doing., the.

selected point of the crystalfs movedabou-t rthe same axis.

If Vdur-ing the preparation of the device thei peint Aof the crystal i-fesi-red for use in determi-ning 'the axisofthe crystal is Anot fin alignment Withthe linger 24.the entire :structure maygbe raised "orxlcwered .through Vthe action ofwhand .wheel 77., to a'c'tuatewthe 'Worm'gear- 7,3 varldxi'lfie worm le tof'eiectY upward :or: downwa'rd;moveb ment of the mechanism carried by the threaded support 31.

- After the desired axis has been located with respect to the center line of the element I9, the maximum reflection being registered in the ionization chamber, the clamps and 3IV of the element I9 may be tightened in place on the flange I8 of the mounting plate I1, after which the clamps 49 may be released and moved to one side by rotation about their screws, to free the assembly including the crystal, the mounting plate and the element I9 so that they may be transferred to the apparatus for cutting the crystal.

Although specific improvements of the invention have been shown and described, it will be understood that they are but illustrative and that various modifications may be made therein Without departing from the scope and spirit of this invention as defined by the appended claims. I

What is claimed is:

l. A device for orienting a quartz crystal with a mounting plate therefor on a base plate rela'- tive to an X-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an end positioned to lie in the X-ray beam, means to support the base plate with the mounting plate and crystal in a position whereby a selected portion of a surface of the crystal engaging the said end of the locating element will be at the point of reflection of the X-ray beam, and means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reflection until the maximum reflection of the X-ray beam is received by the unit from the selected portion of the crystal.

2. A device for orienting a quartz crystal with a mounting plate therefor on a base plate relative to an X-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an end positioned to lie in the X-ray beam, means to support the base plate with the mounting plate and crystal in a position whereby a selected portion of a surface of the crystal engaging the said end of the locating element will be at the point of reflection of the X-ray beam, means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reflection until the maximum reflection of the X-ray beam is received by the unit from the selected portion of the crystal, and means to secure the mounting plate with the crystal at the oriented position to the base plate.

3. A device for orienting a quartz crystal with a mounting plate therefor on a base plate relative to an X-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an end positioned to lie in the X-ray beam, a table to support the base plate with the mounting plate and crystal thereon, means on the table to guide the base plate for movement in a given path with the mounting plate and crystal to position a selected portion of a surface of the crystal in engagement With the end of the locating element at the point of reilection of the X-ray beam, and means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reflection until the maximum reflection of the X-ray beam is received by the unit from the selected portion of the crystal.

4. A device for orienting a quartz crystal with a mounting plate therefor on a base plate relative to an X-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an end positioned to lie in the X-ray beam, a table to support the base plate with the mounting plate and crystal thereon, means on the table to guide the base plate for movement in a given path with the mounting plate and crystal to position a selected portion of a surface of the crystal in engagement with the end of the locating element at the point of reilection of the X-ray beam, means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reilection until the maximum reflection of the X-ray beam is received by the unit from theselectedportion of the crystal, and means to secure the mounting plate with the crystal at the oriented position to the base plate.

5. A device for orienting a quartz crystal with a mounting plate therefor on abase plate relative to an X-ray beam'and a unit sensitive to the X- ray beam, the device comprising a locating element havingr an end positioned to lie in the X- ray beam, means to support the base plate with the mounting plate and crystalk in a position whereby a selected portion of a surface of the crystal engaging the said end of the locating element will be at the point of reilection of the X-ray beam, means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reflection until thevmaximum reflection of the X-ray beam'is received by the unit from the Selected portion of the crystal, and means to support the locating element for movement of the said end thereof into and out of locating position.

6. A device for orienting a quartz crystal with a mounting plate therefor on a base plate relative to an X-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an end positioned to lie in the X-ray beam, a table to support the base plate with the mounting plate and crystal thereon, means on the table to guide the base plate for movement in a given path with the mounting plate and crystal to position a selected portion of a surface of the crystal in engagement with the end of the locating element at the point of reflection of the X-ray beam, means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reflection until the maximumr reflection of the X-ray beam is received by the unit from the selected portion of the crystal, and means to move the table longitudinally of the said axis to position the selected portion of the crystal in general alignment with the end of the locating element.

7. A device for orienting a quartz crystal with a mounting plate therefor on a base plate relative to an X-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an end positioned to lie in the X-ray beam, means to move` the base plate With the mounting plate and crystal in a plane substantially parallel with the X-ray beam to position a surface of the crystal in engagement with the loeating element, means to move the base plate with the mountingy plate and crystal in a direction substantially at right angles to the X-ray beam to position a given point of the surface of the crystal in engagement with the end of the locating element, and means to move the mounting plate with the crystal relative to the base plate about an axis intersecting the point of reflection until crystal.

' mounting plate and crystal.

9. A device for' orienting a Vquartz' crystal withl the maximum reilectl'onof the X-ray beam is received byA the unit 4from the selected point of the A8. A device for Yorlentinga quartz crystal' vwith a. Vmounting `plate therefor on' a base Aplate relative to anX-ray beam and a unit sensitive to the X-ray beam, the device comprising a locating element having an. end positioned 'to lie in the X-ray beam, a. table to support `i-.he baseplate with the mounting plate andcrystal thereon, means on the'table to 'guide the base plate for movement in a given path Vwith kthe mounting plate Aand crystal to position a `selected portion oa surface of the crystal in engagement with thefend ofthe locating element at the point of reiiection ofthe X-ray beam, means to move the mounting plate with the crystal relative tothe base plate about `an axis intersecting the point of reflection until the maximum reecton of the X-ray beam is received by the unit kfromtlie selected portion of the crystal, and means to hold the table against rotary movement with the a mounting plat-'e therefor on a base plate rela tive to an VX--la'y beamrand a unit sensitive to the X-ray beam, theY vdevice* comprising a locat- 'ing element having an end positioned to lie in the X-ray beam, a table to support the'basep'late .with the mounting plate and vcrystal thereon,

the mounting Vplate and crystal, the said guider means on'the table holding the base plate against rotary movement with Vthe mounting plateV and crystal. Y

10. A device for locating a given axisin a quartz crystal, secured to a `mounting Vplate,ina predetermined direction with respect to la' base plate,V

the device Acomprising an X-ray unit to pro- 'ject an X-ray beam in a given path, a unit sensitive tothe Xeray beam disposed at a given anglerwith respect to the said path, a locating element having an end positioned. `to lie in the X-ray beam, means to move the basev plate with the 'mounting plate and crystal to position a given point oixa surface of the crystal in engagement with the end of the locating element, land. means to orient Vthe mounting plate with theV crystal. Yabout the said pointof the crystal 'untilthe x-ray beam is reee'ted into'the' X-'ray b'eam sensitive unit and the said given laxis of the' crystalis 'extending Viin the predetermined direction. .Y

T11. A' device for locati-nga given axis .in a cnzartzv crystal, securedV to a mounting plate, in a predetermined direction With respect to a base plate, the device comprising an X-ray unit to project `Xray beam in aV given path, va unit sensitiveto the X-ray beam disposed at a given angle withrespectfto the said path, a locating element having an end positioned to lie in the X-ray beam, means toimove the baseV 'with the crystal about the said pointl fof the crystal until the X-ray beamris reflected-into the X-ray beam sensitive unit and the said 'given :axis of the crystal' is extending in' the predetermined direction, and a support for the locating element' r'conditioning it for movement into and outV of locating position.

lf2A device' for locating a given axis in a quartz crystal, secured' to amountingiplate', in a predete'rminedr directionV with respect to aY base plate, the devicecomprising an X-ray unit toiproject fanlXLray beam in a given path, a unit sensitive to the Xeray beam disposed at a given angle with respect to the said path, Y alocating'elementhaving Man end vpositioned tolie in the -X-ray beam, means to move the baseplate with the mounting plate-and crystal to position va givenpointv of a surface of the crystal in engagement with the end of the locating element means to orient' the mounting plate with the crystal about the 'said point of the crystal until Vthe X-ray beam is reflected into the X-ray beam' sensitive `unit V'and the said given axis'of the crystal is extending in the predetermined. direction, and means, to vary the position of thebase Aplate Vrelative to the units to present aselected oneoi various points of the-crystal inthe said path. v Y Y.

` JOHN C. LLEY. 

